X-ray Diffractometer (XRD)



Our Rigaku SmartLab X-ray Diffractometer (XRD) is utilized to probe the crystalline structure of matter to determine thickness, composition, relaxation, strain, area uniformity, density, roughness, phase, crystalline texture, % crystallinity, and pore/grain size of both thin films and powder samples.  The software intelligently guides users through both data acquisition and analysis.  This system also features specialized hardware including: x-y stage for mapping samples, small angle x-ray scattering vacuum path, domed hot stage capable of reaching 1100 degrees C, and 2D detector.


  • Maximum sample size                      150 mm Wafer
  • Thickness                                              3.5 mm

Location: RFM 1202
Manager: Jacob Armitage, ja1361@txstate.edu
Backup: Dr. Casey Smith, casey.smith@txstate.edu
Model: Rigaku SmartLab
Donated/funded by: U.S. Department of Defense Army Research Office
W911NF-15-1-0025 (HBCU/MI).
Program Manager Patricia A. Huff
Principal Investigator: Dr. Mark Holtz