JEOL SEM

Description

The JEOL JSM-6010 PLUS/LA Scanning Electron Microscope (SEM) is equipped with low and high vacuum modes. Users can switch between low and high vacuum modes with the simple touch of a button and without the need for venting or hardware exchange. Low vacuum mode allows specimens to be placed into the chamber with little or no preparation. This mode is mostly used for biological samples without pre-treatment. High vacuum mode generally requires a sample to be conductive or coated.

Wet, nonconductive, and unprepared samples can be analyzed under the low vacuum mode without the need to be coated. The super hybrid objective lens forms no magnetic field around the sample. Therefore, solid magnetic samples can be analyzed without restriction.

In situ experiments can be performed with the use of a Gatan C1002 cooling stage that can regulate the sample temperature from -185 °C to 200 °C

Capabilities

• Resolution (HV)                   50 nm @ 20 kV
• Resolution (LV)                    50 nm @ 20 kV
• Magnification                       x5 to x300,000
• Z (WD)                                5 to 48 mm
• T                                         -10° to 90°
• Maximum Specimen Height   30 mm