Leica TXP Microscopy Sample Preparation System
Description
The Leica TXP Microscopy Sample Preparation System is used for precise cutting and polishing of samples before ion milling or ultramicrotomy. The integrated stereomicroscope and ring LED illuminator allow for sample observation and distance measurement during preparation. The tool is capable of reaching speeds ranging from 300 to 20,000 rpm for sawing, milling, grinding, or polishing the desired sample without removing it from its holder.
Capabilities
- Tungsten carbide milling tool
- Diamond, SiC, and neoprene cloth lapping foils for polishing
- Motor spindle speed range 300- 20,000 rpm (100 rpm step size)
- Clamping mechanism for precise diamond core drilling
- Sample size up to 60 mm² maximum
- Specimen pivot arm allows for sample observation from 0° to 60°
- Feed wheel for manual advance in steps of 0.5, 1, 10, or 100 µm
Related Equipment
Location: Supple 171
Manager: Dr. Casey Smith, casey.smith@txstate.edu
Model: Leica EM TXP