Pelco Dimpler
Description
This equipment is used to mechanically pre-thin Transmission Electron Microscopy samples prior to Ar+ ion beam thinning to electron transparency. The tools either “flat” or “dimple” the surface(s) of a 3mm dia disc through a series of grinding and/or polishing steps. The abrasive material is typically mono or polycrystalline diamond suspension with particle diameters of 0.5-15 µm.
Capabilities
- Rapid and controlled mechanical thinning of TEM specimens.
- Sample diameter = 3mm
- Max sample thickness 1mm (0.5mm is ideal)
Related Equipment
Location: Supple 171
Manager: Dr. Casey Smith, casey.smith@txstate.edu
Model: Pelco Dimpler
Generously funded by the Materials Application Research Center