Description
ChemiSEM Technology transforms scanning electron microscopy into an intelligent, data-driven analytical experience. By seamlessly integrating point analysis, line scanning, and full X-ray elemental mapping, it delivers simultaneous structural and chemical insight within a single, intuitive workflow; empowering researchers to confidently interpret the complete materials picture.
Embedded within the Axia ChemiSEM, this advanced SEM-EDS platform combines ultra-high magnification exceeding 100,000× with high-resolution imaging and precise elemental microanalysis, all with minimal sample preparation. A unified, expertly designed interface provides comprehensive control of imaging, spectral analysis, and data handling, enabling rapid navigation, automated acquisition, and advanced visualization tools such as quantitative elemental maps, phase distribution analysis, and color-coded overlays. The result is faster, more reliable insight, enhanced analytical accuracy, and a clearer understanding of material composition, structure, and defects.
Capabilities
- ChemiPhase
- Automated, unbiased phase identification using statistical analysis
- Detects major, minor, and trace phases down to a single pixel
- Handles overlapping peaks and unexpected elements
- Requires very low X-ray counts and delivers fast results
- Simple image–spectrum output for easy interpretation
- Workflow & Quantification
- Fast acquisition with minimal user input
- Accurate phase-specific quantification from low-count data
- Reduced complexity for complex samples
- Drift Correction
- Automatic correction of sample drift during acquisition
- Enables high magnification and long acquisition times
- Works with very short dwell times
- ChemiView
- Complete offline data analysis and reporting
- Save, reprocess, compare, and customize reports anywhere